Dr Jo Sharp
MA (Cantab), MSc, PhD
Research Associate
Address:
Department of Materials Science and Engineering
Sir Robert Hadfield Building
Mappin Street, Sheffield, S1 3JD
Telephone: +44 (0) 114 222 5989
Fax: +44 (0) 114 222 5943
Email: j.sharp@sheffield.ac.uk
I obtained my MSc and MA (Natural Sciences) from Cambridge in 2004 and went on to complete a PhD with Paul Midgley in the HREM group of the Materials Science department at Cambridge. After this I tried a short stint in a university spinoff company in Sheffield before taking up this PDRA position with Tony West and Mark Rainforth, which runs until Autumn 2012. In my spare time I enjoy kayaking, creative arts and sleeping.
Research interests
My research interests are many and varied. Currently I am working primarily with fine-structure EELS as applied to ceramic materials and the investigation of their electrical properties, and exploring other TEM techniques as required for this research.
During my PhD my research interests were electron tomography of crystal defects, using weak-beam dark-field microscopy and annular dark-field STEM, and the application of tomographic reconstruction techniques to these types of images. In the future I may return to tomography or continue to explore other avenues.
Current research
I am currently working on a selection of projects. I work with Nahum Maso to characterise defects in doped barium titanate and Lizz Cedillo on the effects of different heat treatments on undoped barium titanate, using near-edge EELS and aberration over-corrected HREM. Additionally I am investigating the phase transitions and electrochemical behaviour of lithium battery cathode materials with Nik Reeves, using fine-structure effects in quantitative EELS.
Key publications
- J. S. Barnard, A. S. Eggeman, J. Sharp, T. A. White, P. A. Midgley, Dislocation electron tomography and precession electron diffraction - minimising the effects of dynamical interactions in real and reciprocal space, Philosophical Magazine 90, April 2010.
- S Hata, K Kimura, H Gao, S Matsumura, M Doi, T Moritani, J S Barnard, J R Tong, J H Sharp, P A Midgley, Electron tomography imaging and analysis of gamma prime and gamma domains in Ni-based superalloys, Advanced Materials 20, 1905-1909, 2008.
- J H Sharp, J S Barnard, K Kaneko, K Higashida and P A Midgley, Dislocation tomography made easy: a reconstruction from ADF STEM images obtained using automated image shift correction, 2008 J. Phys.: Conf. Ser. 126 012013 (EMAG 2007)
- J S Barnard, J Sharp, J R Tong and P A Midgley, High-resolution three-dimensional imaging of dislocations, Science 313, 319-, 2006.
- J S Barnard, J Sharp, J R Tong and P A Midgley, Three-dimensional analysis of dislocation networks in GaN using weak-beam dark-field electron tomography, Phil. Mag. 86, 4901-4922, 2006.
- J Sharp, J Barnard, J Tong and P Midgley, High-resolution electron tomography of dislocations, 16th International Microscopy Congress (IMC16), poster presentation, September 2006, Sapporo, Japan.