The University of Sheffield
Department of Materials Science and Engineering

The X-ray Diffraction Small Research Facility: Applications

With a range of X-radiations (Cu Kα1, Mo Kα1, Co Kα) and the facility to collect diffraction patterns at any temperature between -190 to 900 ºC, the X-ray Diffraction Small Research Facility at the Department of Materials Science and Engineering is well suited to meet your materials characterisation needs using high resolution STOE transmission, or PanAlytical & Bruker Bragg-Brentano diffractometers.

We offer a bespoke specialist service that is scientifically rigorous but adaptable to meet the specific demands of a particular customer or sample.  To discuss possible contract work or request a quote for work, contact Dr Nik Reeves-McLaren.  We try to complete all contract works within 2 weeks of receipt of samples, where possible.

Phase Analysis

Phase analysis is the analysis of crystalline solids – finding the answer to the question `what is it?´ – is the most common application of X-ray diffraction. We compare quality diffraction patterns against the 2004 edition of the ICDD´s Powder Diffraction File, a reference database of more than 130,000 reported crystalline phases to find the answer.

Retained Austenite Calculation

We offer a long established service to the steel industry for the measurement of retained austenite contents in ferrous steels using methods based on ASTM Standard Practice E975-84.

Quantitative Phase Analysis using the Rietveld Method

Successive round robin studies have shown that the most accurate way of conducting quantitative phase analysis is by applying the Rietveld method to powder diffraction data. More than a full pattern fitting method, we solve the crystal structure of each constituent phase to give you the most accurate quantification possible; spiking with known standards even then allows the measurement of percentage crystallinity in a given sample!

Advanced Methodology

We also offer crystallite size determination by XRD, residual strain analysis, lattice parameter determination, solid solution studies, glancing-angle XRD and crystal structure solution using the Rietveld method.