Dr Ian Ross
Experimental Officer
email : i.ross@sheffield.ac.uk
tel: +44 (0) 114 222 5989
fax: +44 (0) 114 222 5143
Current Position
- Experimental Officer: Kroto Centre for High Resolution Imaging and Analysis, EPSRC FEGTEM and Focused Ion Beam facility (2009).
Previous Positions and Qualifications
- Post Doctoral Research Assistant, University of Sheffield (1999/2009): Nano-technology.
- Post Doctoral Research Fellow, University of Southampton (1997/9): Bio-composites.
- PhD, University of Liverpool, UK, (1998): Materials Science/Nano-particle Research
- MSc(Eng) University of Liverpool, UK (1994): Advanced Engineering Materials
- Graduate of the Institute of Ceramics, Staffordshire University, UK (1991)
- Ceramic Technologist, Steetley Building Products Ltd/Redland Brick Ltd (1986/92)
Professional Society Membership
- Member of the Institute of Physics (IOP) (Chartered Physicist 2000)
- Fellow of the Royal Microscopical Society
Research interests
Dr Ross's main research interests centre on the development of advanced electron microscopy and associated analytical techniques and their application to the characterisation of a range of nano-structured materials. These have included:
- Chemical and interface analysis using electron energy-loss spectroscopy (EELS).
- Structural characterisation of engineering ceramics, oxide layers and metal hybrid nano-particles.
- Analysis of semiconductor devices, quantum dots and thin films.
- Nano-structured metal-nitride protective surface coatings.
- Development of focused ion beam techniques for advanced optical device fabrication and sample preparation.
Recent research topics include
- Application of aberration corrected TEM/STEM (Sheffield JEOL 2200FS/R005)
- Characterisation of nano-structured PVD thin films (InnovaTiAl) using a broad range of advanced electron microscopy techniques (FEG-SEM, FEG-TEM/STEM) including high spatial resolution aberration corrected microscopy (Daresbury- SuperSTEM), Raman microscopy and XRD.
- Application of focused ion beam microscopy to study site specific oxidation, corrosion and wear in advanced PVD coatings.
- Characterisation of SiGe/Si hetero-structures for Terahertz laser applications.