Electronic and Electrical Engineering

Professor John Rodenburg

email : j.m.rodenburg@sheffield.ac.uk

tel: +44 (0) 114 222 5391

Current Position

• Appointed in the Department of Electronic and Electrical Engineering, University of Sheffield, in 2003

Previous Positions

• Professor of Materials Analysis in the Materials and Engineering Institute of the Sheffield Hallam University (1999-2003)
  
  
• University Royal Society Research Fellow based in the Cavendish Laboratory (Physics Department) of the University of Cambridge (1989-1999)
  
  
• Research Fellow (1986-1989) and Fellow (1989-1999) of Murray Edwards College (formerly New Hall), University of Cambridge.
  
  

Qualifications

• PhD (Cantab) ‘Detection and interpretation of electron microdiffraction patterns’
  
  
• BSc (Exeter) Physics

Professional Society Membership

• Fellow of the Institute of Physics
  
  
• Fellow of the Royal Microscopical Society
  
  
• Chartered Physicist

Current Research

• Lensless imaging via iterative solution of the diffraction phase problem, as applied to visible light imaging, X-ray imaging and atomic-resolution electron imaging. Principal Investigator of the Pi-Phi Consortium: Ultimate Microscopy, involving 7 UK Universities and 3 industrial partners.
  
  
• Chief Scientific Officer and Founding Director of Phase Focus Ltd
  
  Lensless imaging – some selected papers:
  
  Rodenburg JM
  Ptychography and related diffractive imaging methods
  Advances in Imaging and Electron Physics 150 (2008) 87-184
  
  Rodenburg JM, Hurst AC, Cullis AG, Dobson BR, Pfeiffer F, Bunk O, David C, Jefimovs K and Johnson I
  Hard X-ray lensless imaging of extended objects
  Physics Review Letters 98 (2007) No 034801
  
  Rodenburg JM, Hurst AC and Cullis AG
  Transmission microscopy without lenses for objects of unlimited size
  Ultramicroscopy 107 (2007) 227-231
  
  Faulkner HML and Rodenburg JM
  Error tolerance of an iterative phase retrieval algorithm for moveable illumination microscopy
  Ultramicroscopy 103 (2005) 153-164
  
  Rodenburg, J.M. and Faulkner, H.M.L
  A phase retrieval algorithm for shifting illumination
  Applied Physics Letters 85 (21) (2005) 4795-4797
  
  Faulkner, H.M.L. and Rodenburg, J.M
  Moveable aperture lensless transmission microscopy: a novel phase retrieval algorithm
  Physics Review Letters, 93 (2) (2004) 023903/1-4
  
  

Other Research Activity

• Instrumentation: Imaging mechanisms in environmental scanning electron microscopy (ESEM), quantification of glow discharge optical emission spectroscopy (GDEOS) and high temperature imaging of steel grain growth in SEM via a novel detector technology.
  
  
• Development of detector technology for scanning transmission electron microscope (STEM), including recording methods for coherent electron diffraction and applications of real-time autocorrelation for measuring bonding angle distributions in amorphous solids. Development of parallel electron energy loss spectroscopy and energy-filtered imaging.
  
  
• Materials: Development of YbAG via a low-temperature sol-gel route, strain measurements in semi-conductor multilayers, electron microscopy examination of nitride PVD coating technology for cutting tools and sharp edges.