Professor John Rodenburg

tel: +44 (0) 114 222 5391

Appointed in the Department of Electronic and Electrical Engineering, University of Sheffield, in 2003

Professor of Materials Analysis in the Materials and Engineering Institute of the Sheffield Hallam University (1999-2003)
University Royal Society Research Fellow based in the Cavendish Laboratory (Physics Department) of the University of Cambridge (1989-1999)
Research Fellow (1986-1989) and Fellow (1989-1999) of Murray Edwards College (formerly New Hall), University of Cambridge.

PhD (University of Cambridge) ‘Detection and interpretation of electron microdiffraction patterns’
BSc (Exeter) Physics

Lensless imaging via iterative solution of the diffraction phase problem, as applied to visible light imaging, X-ray imaging and atomic-resolution electron imaging. Principal Investigator of the Pi-Phi Consortium: Ultimate Microscopy, involving 7 UK Universities and 3 industrial partners.
Chief Scientific Officer and Founding Director of Phase Focus Ltd

Lensless imaging – some selected papers:

Humphry MJ, Kraus B, Hurst AC, Maiden AM and Rodenburg JM
Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging
Nature Communications 3:730 (2012) DoI: 10.1038/ncomms1733

Maiden AM, Rodenburg, JM and Humphry, MJ
Optical ptychography: a practical implementation with useful resolution
Optics Letters 35 (2010) 2585-2587

Hue F, Rodenburg, JM, Maiden, AM, Sweeney, F, and Midgley,PA
Wave-front phase retrieval in transmission electron microscopy via ptychography
Physical Review B 82 (2010) Article Number: 121415

Maiden, AM, and Rodenburg, JM
An improved ptychographical phase retrieval algorithm for diffractive imaging
Ultramicroscopy 109 (2009) 1256-1262

Rodenburg JM
Ptychography and related diffractive imaging methods
Advances in Imaging and Electron Physics 150 (2008) 87-184

Rodenburg JM, Hurst AC, Cullis AG, Dobson BR, Pfeiffer F, Bunk O, David C, Jefimovs K and Johnson I
Hard X-ray lensless imaging of extended objects
Physics Review Letters 98 (2007) No 034801

Instrumentation: Imaging mechanisms in environmental scanning electron microscopy (ESEM), quantification of glow discharge optical emission spectroscopy (GDEOS) and high temperature imaging of steel grain growth in SEM via a novel detector technology.
Development of detector technology for scanning transmission electron microscope (STEM), including recording methods for coherent electron diffraction and applications of real-time autocorrelation for measuring bonding angle distributions in amorphous solids. Development of parallel electron energy loss spectroscopy and energy-filtered imaging.
Materials: Development of YbAG via a low-temperature sol-gel route, strain measurements in semi-conductor multilayers, electron microscopy examination of nitride PVD coating technology for cutting tools and sharp edges.