USEFIB Research

Here are some Adobe Acrobat Documents of recent research projects:

Focused Ion Beam Micro-Milling of GaN Photonic Devices with Gas Enhanced Etching Techniques

Semiconductor Micro-pillar fabrication via Focused Ion Beam

The Application of FIB to the Analysis and Nano-Fabrication of Novel Semiconductor Devices

Failure analysis studies in pseudomorphic SiGe channel p-MOSFET devices

High Speed Cutting of Ti Alloys

Quantification of Surface Structure Developed During Wear and Thermomechanical Processing

Enhanced Superconducting Transition Temperature in Focused Ion Beam Deposited Nano-wires